Marvin Test Solutions Inc. TS-700 Core Functional Test System with JTAG Boudary Scan
The TS-720A is a member of Marvin Test Solutions' TS-700 family of core functional test systems. It is designed to provide a flexible, modular platform for functional test applications, supporting a wide range of digital, analog, and mixed-signal test requirements. The TS-720A integrates JTAG boundary scan capabilities, enabling advanced device programming and test functions. The system features a scalable PXI-based architecture, allowing users to configure the system with various instruments and interface options to meet specific test needs. It is suitable for both development and production environments, offering high throughput and reliability. The TS-720A supports comprehensive test sequencing, data logging, and diagnostics, and is compatible with Marvin Test Solutions' software tools for test development and execution. Its modular design ensures ease of maintenance and future expansion, making it a robust solution for complex electronic test challenges.
