National Instruments Corporation STS RF Eval DIB, Up To 96 Ports With 2X12 Position Ganged RF Cables
The National Instruments 789452-01 is an STS RF Evaluation Device Interface Board (DIB) designed for use with the NI Semiconductor Test System (STS). This DIB supports up to 96 ports and includes two 12-position ganged RF cables, enabling high-density, multi-site RF device testing. The board is engineered to facilitate rapid evaluation and characterization of RF devices in a production test environment, providing reliable signal integrity and robust connectivity. It is compatible with NI's modular instrumentation and software platforms, ensuring seamless integration and efficient workflow for semiconductor test engineers.
