Rohde & Schwarz Analog Source and Measurement Module (DMM) for CompactTSVP, incl. TS-PDC. Deployment for system selftest, CPCI/PXI, 16 Bit, 200 kS
The Rohde & Schwarz TS-PAM (part number 1142.9503.02) is an Analog Source and Measurement Module designed for use with the CompactTSVP (Test System Versatile Platform). This module includes the TS-PDC and is intended for deployment in system self-test applications. It supports CPCI/PXI platforms and features a 16-bit resolution with a sampling rate of up to 200 kS/s. The TS-PAM provides precise analog measurement and source capabilities, making it suitable for automated test systems that require high accuracy and reliability. Its integration with CompactTSVP ensures seamless operation within modular test environments.
