Marvin Test Solutions Inc. Dynamic Digital I/O (3U), 32 ch., per pin voltage & direction control; 125 MHz w/64 M Vectors per channel; per pin timing & PMU
Dynamically Controlled High Speed Digital I/O PXI Card
The GX5296 from Marvin Test Solutions is a 3U PXI dynamic digital I/O instrument offering 32 channels with per-pin voltage and direction control. Each channel supports up to 125 MHz vector rates and provides 64 million vectors per channel. The module features per-pin timing and parametric measurement unit (PMU) capabilities, enabling precise signal generation and analysis. It is designed for high-performance digital test applications, supporting flexible pattern sequencing, advanced triggering, and deep memory. The GX5296 is suitable for semiconductor, board, and system-level testing, and integrates seamlessly with Marvin Test Solutions' software tools.
