Keysight Technologies Inc. Parametric Test System Controller
The Keysight N9100AU-N9171C-ATO is a configurable option for the N9100 Series Parametric Test System Controller. This product is designed to provide advanced control and automation capabilities for semiconductor parametric testing applications. It integrates seamlessly with Keysight's parametric test systems, offering high performance, reliability, and flexibility for a wide range of device characterization tasks. The controller supports various test modules and software options, enabling users to customize their test setups according to specific measurement requirements. It is engineered to deliver precise data acquisition, robust system management, and efficient workflow integration, making it suitable for both R&D and production environments.
