Marvin Test Solutions Inc. Dynamic Digital I/O (3U), 32 ch., per pin voltage & direction control; 100 MHz w/256 MB memory; per pin PMU
Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
The GX5295 from Marvin Test Solutions is a 3U PXI dynamic digital I/O instrument featuring 32 channels with per-pin voltage and direction control. Each channel supports data rates up to 100 MHz and includes a per-pin parametric measurement unit (PMU) for advanced test capabilities. The module is equipped with 256 MB of vector memory, enabling complex test patterns and flexible stimulus/response operations. The GX5295 is designed for high-performance digital functional test applications, offering programmable voltage levels, edge placement, and timing per channel. It is suitable for semiconductor, board, and system-level testing, and integrates seamlessly into PXI-based test systems.
