Product specs for National Instruments Corporation 782857-01

The new NI PXIe-4139 system source measure unit (SMU) delivers high power, precision, and speed in a single-slot PXI Express module. The combination of power, precision, and speed make this SMU suitable for a broad range of applications including manufacturing test or lab characterization with devices ranging from ICs (including PMICs and RFICs) and discrete devices (including LEDs and optical transceivers) to board-level test. For high-channel-count applications, you can achieve up to 17 SMU channels in a single 4U PXI chassis.

The NI PXIe-4139 features 4-quadrant operation and sources up to 20 W of DC power with voltage and current boundaries at 60 V and 3 A. With the unique ADC technology of this module, you can perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions at speeds up to 1.8 MS/s. The NI PXIe-4139 is a hardware-timed instrument with a high-speed sequencing engine to synchronize acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.

Extended Range Pulsing
For applications requiring higher current, the NI PXIe-4139 can pulse up to 10 A at 50 V for delivering up to 500 W of instantaneous power. Depending on the load and SourceAdapt control settings, pulse widths can be as short as 50 s. These short pulse widths not only allow tests to complete faster but also keep the local heating of the device under test to minimal levels so test engineers can perform tests that otherwise might require heat sinks or other thermal control mechanisms.

NI SourceAdapt: The Next-Generation SMU Technology
The NI PXIe-4139 features SourceAdapt technology. With this next-generation SMU technology, you can custom-tune the SMU response to any given load for optimum response with maximum stability and minimum transients. Removing overshoots helps protect the device under test while eliminating oscillations that are critical for system stability. Additionally, minimum rise and fall times help achieve the fastest possible test times. This feature is particularly useful when dealing with reactive loads, especially capacitance loads encountered across various test applications.