Product specs for National Instruments Corporation 780993-03

The NI PXIe-6545 digital waveform generator/analyzer features 32 bidirectional channels clocked at a maximum of 200 MHz. The selectable voltage levels of 1.2, 1.5, 1.8, 2.5, and 3.3 V work with the most common logic levels and are ideal for conducting tests on semiconductor devices, such as analog-to-digital converters (ADCs), digital-to-analog converters (DACs), ASICs, and microcontrollers. For example, with a 16-bit, parallel interface, 200 MS/s dual-channel DAC, you can use the NI PXIe-6545 to generate data on 32 lines (continuously or in bursts) to test the DAC at its maximum clock rate. You can also pair this device with other NI modular instruments, including digitizers or source measure units (SMUs), to characterize the DAC for various tests at higher rates.

Streaming rates of 660 MB/s to host PC memory and 400 MB/s from host PC memory make the NI PXIe-6545 ideal for applications requiring high streaming rates. You can use this module to stream high-definition digital video signals for generation or acquisition and to test LCD screens, television components, high-definition signals (up to 1080 p at 60 Hz), RF baseband devices, and HD radio.

The NI PXIe-6545 also features enhanced timing and synchronization capabilities. The onboard DDS clock provides subhertz resolution up to 200 MHz, helping you clock data (generation or acquisition) with higher precision without using an external clock. In addition, you can now test applications requiring arbitrary clock frequencies and export the onboard clock to other instruments through the backplane of a PXI Express chassis or through an SMB connector on the front panel of the device. Additionally, you can clock your data by importing an external clock through the front panel or backplane. With these features, you can synchronize the NI PXIe-6545 with other analog or digital instruments.