Product Description:
National Instruments Corporation 780587-15 NI PXIe-2515 32-Ch High-Speed Digital I/O Signal Insertion Switch
- 35 high-bandwidth digital I/O pass-through lines for clock rates up to 200 MHz
- BNC connectors that provide access to each digital line via two signal insertion buses
- Insert SMUs for DC parametric tests or insert digitizers for analog characterization
- 50 MHz typical bandwidth on insertion buses
- Compatibility with all single-ended NI high-speed digital I/O (HSDIO) products
- Configure Complete PXI System
- View Data Sheet
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The NI PXIe-2514 fault insertion unit (FIU) is designed for use in hardware-in-the-loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels, which, when closed, make the switch transparent to the system. You can open or short these channels to one of two fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the NI LabVIEW Real-Time Module, this FIU is ideal for validating the reliability of control systems such as engine control units (ECUs), full authority digital engine controls (FADECs), and more with up to 40 A loading conditions.
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