National Instruments Corporation NI PXIe-2514 7-Channel 40A FIU Switch Module
- Simulate open, pin-to-pin, short-to-battery, and short-to-ground faults
- 7 channels with two fault bus lines
- Up to 40 A and 28 V
- Control from LabVIEW Real-Time for deterministic operation
- Triggering via the PXI backplane
- Configure Complete PXI System
- Data Sheet
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The NI PXIe-2512 fault insertion unit (FIU) is designed for use in hardware-in-the-loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels, which, when closed, make the switch transparent to the system. You can open or short these channels to one of two fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the NI LabVIEW Real-Time Module, this FIU is ideal for validating the reliability of control systems such as engine control units (ECUs), full authority digital engine controls (FADECs), and more with up to 10 A loading conditions.