Keithley Instruments Inc. 2520 PULSED LASER DIODE TEST SYSTEM
The Keithley 2520 Pulsed Laser Diode Test System is specifically designed for testing laser diodes in pulsed mode, providing precise current sourcing and voltage measurement capabilities. It features a high-speed pulsed current source (up to 5A, 10¼s5ms pulse widths) and integrated measurement functions for voltage and light output, enabling complete LIV (Light-Current-Voltage) characterization. The 2520 offers built-in pulse generation, measurement synchronization, and safety interlocks to protect sensitive laser devices. Its GPIB interface allows for automated test integration, making it suitable for both R&D and production environments.